It’s been almost six years since the first IEEE 1801 standard was officially published in March of 2009, but the standard can trace its roots back to years before that date. On May 30, 2013 the IEEE ...
Standard test data format (STDF), the most commonly used data format for datalogging storage of semiconductor test information, is a binary format produced by automatic test equipment (ATE). Data in ...
In 2006 and 2007, there was an enormous documents standards war between Microsoft, with its OpenXML documents format, and the open-source community with its Open Document Format (ODF). In the end, ...
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