Livermore, Calif. — FormFactor, Inc. has expanded its TrueScale probe card family for wire bond system-on-chip (SoC) devices with the introduction of its PP40 wafer probe card. This probe card enables ...
LIVERMORE, Calif., May 29, 2020 (GLOBE NEWSWIRE) -- FormFactor, Inc. (NASDAQ:FORM), a leading semiconductor test and measurement supplier, today announced the release of the SmartMatrix 3000XP probe ...
Taiwan-based IC test interface solutions provider Chunghwa Precision Test Tech (CHPT) has struck a strategic collaboration deal with US-based Cohu, a provider of test and inspection equipment, to ...
Probe card demand for 3D ICs is promising, according to IC testing interface solution provider Chunghwa Precision Test Tech (CHPT), which also claimed it will be one of the new suppliers capable of ...
Simple mechanical changes can significantly improve probe card performance. Epoxy-ring probe cards with 2,000 or more probes are economical solutions to multi-DUT parallel test. The key to repeatable ...
Test facilities are beginning to implement real-time maintenance, rather than scheduled maintenance, to reduce manufacturing costs and boost product yield. Adaptive cleaning of probe needles and test ...
Test is a dirty business. It can contaminate a unit or wafer, or the test hardware, which in turn can cause problems in the field. While this has not gone unnoticed, particularly as costs rise due to ...
The continuing advances in semiconductor functionality, density, and chip-level integration are generating new challenges in accessing devices for test and controlling the physical and electrical ...
I’ve had a fairly varied early part of my career in the semiconductors business: a series of events caused me to jump disciplines a little bit, and after one such event, I landed in the test ...
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